Physical review letters

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  Año 2006, Vol. 96, Número 15

  • Colossal Magnetocapacitance and Colossal Magnetoresistance in HgCr~2S~4

    S. Weber, P. Lunkenheimer

    págs. 157202-157400

    

  • Dispersion of Surface Plasmon Polaritons on Metal Wires in the Terahertz Frequency Range

    K. Wang, D. M. Mittleman

    pág. 157401

    

  • Enhanced Raman Scattering from Individual Semiconductor Nanocones and Nanowires

    L. Cao, Barzin Y. Nabet, J. E. Spanier

    pág. 157402

    

  • Electronic Origins of Structural Distortions in Post-Transition Metal Oxides: Experimental and Theoretical Evidence for a Revision of the Lone Pair Model

    R. G. Egdell, D. J. Payne

    págs. 157403-157600

    

  • Origin of Fine Structure in Si 2p Photoelectron Spectra at Silicon Surfaces and Interfaces

    O. V. Yazyev, A. Pasquarello

    pág. 157601

    

  • In-Plane and Out-of-Plane Ferroelectric Instabilities in Epitaxial SrTiO~3 Films

    T. Yamada, A. K. Tagantsev, J. Petzelt

    pág. 157602

    

  • Escape Configuration Lattice near the Nematic-Isotropic Transition: Tilt Analogue of Blue Phases

    B. Chakrabarti

    págs. 157801-158000

    

  • Dynamics of Impact Cratering in Shallow Sand Layers

    J. F. Boudet, Y. Amarouchene

    pág. 158001

    

  • Mesoscopic Theory of Critical Fluctuations in Isolated Granular Gases

    Alvaro Dominguez Alvarez, María Isabel García de Soria Lucena, José Javier Brey Abalo

    págs. 158002-158100

    

  • Pumping Fluids with Periodically Beating Grafted Elastic Filaments

    Y. W. Kim, R. R. Netz

    pág. 158101

    

  • Comment on "Reconciling Coulomb Dissociation and Radiative Capture Measurements"

    M. Gai

    pág. 159201

    

  • Esbensen, Bertsch, and Snover Reply

    H. Esbensen, G. F. Bertsch

    págs. 159202-159700

    

  • Comment on "Negative Refraction at Optical Frequencies in Nonmagnetic Two-Component Molecular Media"

    T. G. Mackay, A. Lakhtakia

    pág. 159701

    

  • Chen, Fischer, and Wise Reply

    P. Fischer, Y.-F. Chen, F. W. Wise

    pág. 159702