Technometrics: A journal of statistics for the physical, chemical and engineering sciences

• 

  Año 2010, Vol. 52, Número 4

  • The 2009 Technometrics Priczes.

    págs. 373-375

    

  • Editor's Report.

    David M. Steinberg

    págs. 376-378

    

  • Reliability Growth Management Metrics and Statistical Methods for Discrete-Use Systems.

    J. Brian Hall, Paul M. Ellner, Ali Mosleh

    págs. 379-388

    

  • Reliability Growth Management Metrics and Statistical Methods for Discrete-Use Systems. Comment.

    Donald P. Gaver, Patricia A. Jacobs

    págs. 389-390

    

  • Reliability Growth Management Metrics and Statistical Methods for Discrete-Use Systems. Comment.

    Patrick D.T. O'Connor

    págs. 391-392

    

  • Reliability Growth Management Metrics and Statistical Methods for Discrete-Use Systems. Comment.

    Ananda Sen, Arthur Fries

    págs. 393-395

    

  • Reliability Growth Management Metrics and Statistical Methods for Discrete-Use Systems. Comment.

    Nozer D. Singpurwalla

    pág. 396

    

  • Reliability Growth Management Metrics and Statistical Methods for Discrete-Use Systems. Comment.

    Alyson G. Wilson, Christine M. Anderson-Cook

    págs. 397-400

    

  • Reliability Growth Management Metrics and Statistical Methods for Discrete-Use Systems. Rejoinder.

    J. Brian Hall, Paul M. Ellner, Ali Mosleh

    págs. 401-408

    

  • Optimal Row-Column Designs in High-Throughput Screening Experiments.

    Xianggui Qu

    págs. 409-420

    

  • Generalized Latin Hypercube Design for Computer Experiments.

    Holger Dette, Andrey Pepelyshev

    págs. 421-429

    

  • Functional NOVA in Computer Models With Time Series Output.

    Dorin Drignei

    págs. 430-437

    

  • Bayesian Startup Phase Mean Monitorint of an Autocorrelated Process That Is subject to Random Sized Jumps.

    Panagiotis Tsiamyrtzis, Douglas M. Hawkins

    págs. 438-452

    

  • Inference Under Progressively type II Right-Censored Sampling for Certain Lifetime Distributions.

    Bing Xing Wang, Keming Yu, M.C. Jones

    págs. 453-460