Statistical Shape Analysis of Experiments for Manufacturing Processes.
Enrique del Castillo, Bianca M. Colosimo
págs. 1-15
Efficient MCMC Schemes for Computationally Expensive Posterior Distributions.
Mark Fielding, David J. Nott, Shie-Yui Liong
págs. 16-28
Statistical Emulation of Large Linear dynamic Models.
P.C. Young, M. Ratto
págs. 29-43
Robust Ridge Regression for High-Dimensional Data.
Ricardo A. Maronna
págs. 44-53
Nearly-Isotonic Regression.
Ryan J. Tibshirani, Holger Hoefling, Robert Tibshirani
págs. 54-61
Efficient Designs With Minimal Aliasing.
Bradley Jones, Christopher J. Nachtsheim
págs. 62-71
Inference for the Lognormal Mean and Quantiles Based on Samples With Left and Right Type I Censoring.
K. Krishnamoorthy, Avishek Mallick, Thomas Mathew
págs. 72-83
A Multivariate Sign EWMA Control Chart.
Changliang Zou, Fugee Tsung
págs. 84-97
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