Analyzing the Effect of Process Parameters on the Shape of 3D Profiles
Bianca M. Colosimo, Massimo Pacella
págs. 169-195
Profile Monitoring with Binary Data and Random Predictors
Yanfen Shang, Fugee Tsung, Changliang Zou
págs. 196-208
A Bayesian Hierarchical Power Law Process Model for Multiple Repairable Systems with an Application to Supercomputer Reliability
Kenneth J. Ryan, Michael S. Hamada, C. Shane Reese
págs. 209-223
A Bayesian Plotting Method for Fractional Factorial Data Analysis
Theodore T. Allen, Ravishankar Rajagopalan
págs. 224-236
Methods for Monitoring Multiple Proportions When Inspecting Continuously
Anne G. Ryan, Lee J. Wells, William H. Woodall
págs. 237-248
Monitoring the Coefficient of Variation Using EWMA Charts
Philippe Castagliola, Giovanni Celano, Stelios Psarakis
págs. 249-265
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