págs. 278-285
Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence
W. Goes, Y. Wimmer, A. Mounir EL Sayed, G. Rzepa, M. Jech, Alexander L. Shluger, T. Grasser
págs. 286-320
Special issue: International conference on thermal, mechanical & multiphysics simulation and experiments in micro- and nano-electronics and systems [EuroSimE2017]
págs. 321-321
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