Metrologia: International journal of scientific metrology

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  Año 2003, Vol. 40, Número 1. Dedicado a: 8th International Conference on New Developments in Optical Radiometry, Newrad 2002 NIST, Gaithersburg, MD, USA

  • Reversible and apparent ageing effects in infrared detectors

    E. Theocharous, N. P. Fox

    págs. 136-140

    

  • Quantum efficiency of solar-blind semiconductor photodiodes in the far ultraviolet

    R. E. Vest, B. Hertog, Peter Chow

    págs. 141-144

    

  • Present status of radiometric quality silicon photodiodes

    R. Korde, C. Prince, D. Cunningham, R. E. Vest, E. Gullikson

    págs. 145-149

    

  • Anomalous non-linear behaviour of InGaAs photodiodes with overfilled illumination

    Pedro Corredera Guillén, María Luisa Hernanz, Miguel González Herráez, Joaquín Campos Acosta

    págs. 150-153

    

  • Linearity of InGaAs photodiodes

    Howard W. Yoon, James J. Butler, T. C. Larason, G. P. Eppeldauer

    págs. 154-158

    

  • Difference in the photocurrent of semiconductor photodiodes depending on the polarity of current measurement through a contribution from the photoemission currrent

    T. Saito

    págs. 159-162

    

  • Spectral characterization of Ge trap detectors and photodiodes used as transfer standards

    K. D. Stock, R. Heine, H. Hofer

    págs. 163-166

    

  • Correlations in primary spectral standards

    J. L. Gardner

    págs. 167-171

    

  • The realization of the NIST detector-based spectral irradiance scale

    Howard W. Yoon, Charles E. Gibson, P. Y. Barnes

    págs. 172-176

    

  • Primary realization of a spectral irradiance scale employing monochromator-based cryogenic radiometry between 200 nm and 20 mm

    E. W. M. van der Ham, H. C. D. Bos, C. A. Schrama

    págs. 177-180

    

  • Spectral responsivity scale in the visible range based on single silicon photodiodes

    Joaquín Campos Acosta, Alicia Pons, Pedro Corredera Guillén

    págs. 181-184

    

  • Development of a new integrating sphere with uniform reflectante for absolute diffuse reflectante measurements

    Hiroshi Shitomi, Y. Mishima, Ichiro Saito

    págs. 185-188

    

  • Irradiance measurements without explicit diffraction corrections

    J. G. Suárez-Romero, E. Tepichín-Rodríguez

    págs. 189-191

    

  • NPL scales for radiance factor and total diffuse reflectance

    C. J. Chunnilall, A. J. Deadman, L. Crane, E. Usadi

    págs. 192-195

    

  • Realization of a spectral radiance scale at KRISS

    Seung Nam Park, Jung Chul Seo, Dong Joo Shin, In Won Lee

    págs. 196-199

    

  • Determination of thin-film parameters from high accuracy measurements of spectral regular transmittance

    S. Nevas, F. Manoocheri, Erkki Ikonen

    págs. 200-203

    

  • Radiation pattern from a double slit illuminated by parametric fluorescence light

    Giorgio Brida, Carlo Novero

    págs. 204-207

    

  • Influence of the beam shape on aperture measurements with the laser beam scanning technique

    M. Stock, R. Goebel

    págs. 208-211

    

  • Degradation of the diffuse reflectance of Spectralon under low-level irradiation

    W. Möller, K. P. Nikolaus, A. Höpe

    págs. 212-215

    

  • Comparison of cryogenic radiometry and thermal radiometry calibrations at NIST using multichannel filter radiometers

    B. Carol Johnson, Steven W. Brown, Keith R. Lykke, Charles E. Gibson, Giulietta Fargion, Gerhard Meister, Stanford B. Hooker, Brian Markham, James J. Butler

    págs. 216-219

    

  • Characterization of filter radiometers with a wavelength-tunable laser source

    M. Noorma, P. Toivanen, F. Manoocheri, Erkki Ikonen

    págs. 220-223

    

  • High-accuracy radiometry in the EUV range at the PTB soft x-ray beamline

    F. Scholze, J. Tümmler, G. Ulm

    págs. 224-228

    

  • Facility for extreme ultraviolet reflectometry of lithography optics

    C. Tarrio, S. Grantham, T. B. Lucatorto

    págs. 229-232