IEE Proceedings: Circuits, devices and systems

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  Año 2003, Vol. 150, Número 2

  • Circuit analysis of active mode parasitic oscillations in IGBT modules

    J. C. Joyce, P. R. Palmer

    págs. 85-91

    

  • Estimation of equivalent circuit parameters for a millimetre-wave GaAs PIN diode switch

    H. Takasu

    págs. 92-94

    

  • Statistical nonlinear model of MESFET and HEMT devices

    A. Di Martino

    págs. 95-103

    

  • Transient response testing of nonlinear analogue circuits using optimised fault sets

    D. Taylor, A. Platts

    págs. 104-112

    

  • Adaptive phase measurement system for surface profile measurement

    W. Houghton, M. R. Belmont, P. R. Shepherd, A. J. Pugh

    págs. 113-118

    

  • Computation of AB^2 multiplication in GF(2^m) using low-complexity systolic architecture

    H. S. Kim, K. Y. Yoo, N. Y. Kim

    págs. 119-123

    

  • Motion estimation using MSD-first processing

    C. W. Jen, C. L. Su

    págs. 124-133

    

  • Frequency offset compensation in fractionally spaced equalisation

    G. A. Mian, A. Neviani, A. Xotta, A. Gerosa

    págs. 134-140

    

  • Expression of transient phenomena at faults on ideal transmission lines by Laguerre functions

    A. Yonemoto, T. Hisakado

    págs. 141-147