The effect of highly ionising particles on the CMS silicon strip tracker
Autores:J.-P. Dewulf, L. Neuckermans, W. Adam, J. Hrubec, O. Bouhali, B. Clerbaux, C. Vander-Velde, P. Vanlaer, W. Beaumont, M. Tasevsky, T. Bergauer, M. Pernicka, E. de Wolf, J. Wickens, R. Fruehwirth, M. Krammer, M. Friedl, W. Waltenberger, E. de Langhe, G. de Lentdecker