Characterization of carrier recombination and trapping processes in proton irradiated silicon by microwave absorption transients

• Autores: P. Luukka, E. Fretwurst, G. Niaura, J. Vaitkus, J. Härkönen, E. Gaubas, E. Tuovinen
• Localización: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, ISSN 0168-9002, Vol. 546, Nº. 1, 2005, págs. 108-112
• Idioma: inglés
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