Observation, modeling, and temperature dependence of doubly peaked electric fields in irradiated silicon pixel sensors
Autores:T. Speer, V. Chiochia, D.A. Sanders, K. Prokofiev, S. Cucciarelli, C. Hörmann, L. Cremaldi, A. Dorokhov, C. Regenfus, S. Son, T. Rohe, M. Konecki, D. Kim, D. Bortoletto, Y. Allkofer, M. Swartz, D. Kotlinski