Characterization of frequency-tripled nanosecond pulsed Ti:sapphire laser injection seeded by a frequency-scanning cw Ti:sapphire laser by use of optogalvanic spectroscopy of silicon atoms

• Autores: H. Kumagai, Y. Shiomi, K. Kyutoku, A. Kobayashi
• Localización: Optics letters: A publication of the Optical Society of America, ISSN 0146-9592, Nº. 20, 2006, págs. 3037-3039
• Idioma: inglés
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