Accuracy and run-time comparison for different potential approaches and iterative solvers in finite element method based EEG source analysis

• Autores: S. Lew, C. H. Wolters, T. Dierkes, C. Röer, R. S. MacLeod
• Localización: Applied numerical mathematics, ISSN-e 0168-9274, Vol. 59, Nº. 8, 2009, págs. 1970-1988
• Idioma: inglés
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• Resumen

  • Accuracy and run-time play an important role in medical diagnostics and research as well as in the field of neuroscience. In Electroencephalography (EEG) source reconstruction, a current distribution in the human brain is reconstructed noninvasively from measured potentials at the head surface (the EEG inverse problem). Numerical modeling techniques are used to simulate head surface potentials for dipolar current sources in the human cortex, the so-called EEG forward problem.

    In this paper, the efficiency of algebraic multi-grid (AMG), incomplete Cholesky (IC) and Jacobi preconditioners for the conjugate gradient (CG) method are compared for iteratively solving the finite element (FE) method based EEG forward problem. The interplay of the three solvers with a full subtraction approach and two direct potential approaches, the Venant and the partial integration method for the treatment of the dipole singularity is examined. The examination is performed in a four-compartment sphere model with anisotropic skull layer, where quasi-analytical solutions allow for an exact quantification of computational speed versus numerical error. Specifically-tuned constrained Delaunay tetrahedralization (CDT) FE meshes lead to high accuracies for both the full subtraction and the direct potential approaches. Best accuracies are achieved by the full subtraction approach if the homogeneity condition is fulfilled. It is shown that the AMG-CG achieves an order of magnitude higher computational speed than the CG with the standard preconditioners with an increasing gain factor when decreasing mesh size. Our results should broaden the application of accurate and fast high-resolution FE volume conductor modeling in source analysis routine.