Coffee Cup Atomic Force Microscopy

• David E. Ashkenaz ^[1] ; W. Paige Hall ^[1] ; Christy L. Haynes ^[1] ; Erin M. Hicks ^[1] ; Adam D. McFarland ^[1] ; Leif J. Sherry ^[1] ; Douglas A. Stuart ^[1] ; Korin E. Wheeler ^[1] ; Chanda R. Yonzon ^[1] ; Jing Zhao ^[1] ; Hilary A. Godwin ^[1] ; Richard P. Van Duyne ^[1]
  1. [1] Northwestern University

     Northwestern University

     Township of Evanston, Estados Unidos

     
• Localización: Journal of chemical education, ISSN 0021-9584, Vol. 87, Nº 3 (March), 2010, págs. 306-307
• Idioma: inglés
• Texto completo no disponible (Saber más ...)
• Resumen

  • In this activity, students use a model created from a coffee cup or cardstock cutout to explore the working principle of an atomic force microscope (AFM). Students manipulate a model of an AFM, using it to examine various objects to retrieve topographic data and then graph and interpret results. The students observe that movement of the AFM cantilever can be monitored by the deflection of a laser beam. Goals for the students are to examine macroscopic objects and relate their measurement technique to the atomic- and molecular-scale measurements of an actual AFM.