Improved inductive-system-level IEC ESD performance for automotive applications using mutual ballasted ESD protection technique

• Autores: Akram A. Salman, Farzan Farbiz, Ann Concannon, Hal Edwards, Gianluca Boselli
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 57, 2016, págs. 47-52
• Idioma: inglés
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• Resumen

  • AbstracA new ESD failure mode under inductive IEC stress of automotive Controller Area Network (CAN) bus is identified. Inductor saturation causes increase of the rise-time from 1 ns to ~ 20 ns, leading to non-uniform conduction in the bidirectional ESD protection circuit. A novel mutual ballasting layout technique is introduced to recover the system level ESD performance.