Yanfen Shang, Fugee Tsung, Changliang Zou
Profile monitoring checks the stability over time of relationships between explanatory and response variables. A control chart is proposed for profiles with random explanatory variables. This proposal integrates an exponentially weighted moving-average scheme and a likelihood ratio test. The proposed scheme is reasonably noncomplex, and simulations show that it performs better than standard methods. A real example from the electronics industry also shows the utility of this approach.
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