Oana Danila, Stefan H. Steiner, Jock Mackay
A binary measurement system is assessed in a situation where no widely-accepted measurement system is available. The standard approach is to repeatedly measure a sample of parts and use a latent class model, but in this case the standard plan is supplemented with available data from previously measured parts. New sampling plans are proposed and compared with the standard plan. Recommendations are given for an assessment study when samples can be taken from a population of previously measured parts.
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