Resumen de Assessing a Binary Measurement System
Oana Danila, Stefan H. Steiner, Jock Mackay
Despite the widespread use of binary measurement systems, little has been written about assessing them. Two plans are proposed here for assessing binary measurement systems that may be used under the assumption that the pass rate of the system is known, as is the case in the assessment of a system used for 100 percent inspection in a production process. The methods provide estimates of the misclassification rates, as well as the portion of conforming items produced.
