Analysis of transistor circuits having multiple DC solutions with the thermal constraint

• Michał Tadeusiewicz ^[1] ; Stanisław Hałgas ^[1]
  1. [1] Technical University of Łódz
• Localización: Compel: International journal for computation and mathematics in electrical and electronic engineering, ISSN 0332-1649, Vol. 30, Nº 4 (Special Issue: ISTET 2009), 2011, págs. 1350-1362
• Idioma: inglés
• Enlaces
  • Texto completo
• Resumen

  • Purpose – The purpose of this paper is to develop a method for finding all the DC solutions in nonlinear circuits with the thermal constraint.

    Design/methodology/approach – The proposed approach employs an algorithm for finding all the DC solutions without thermal constraint, including a new contraction and elimination method, an efficient method for tracing characteristics expressing voltages and power in terms of temperature, and electrical analog of the chip thermal behavior.

    Findings – The paper brings a method that guarantees finding all the DC solutions, considering thermal behavior of the chip, in mid‐scale practical transistor circuits.

    Originality/value – A new contraction and elimination method, being the core of the algorithm for finding all the DC solutions, is proposed. An approach enabling us to consider a feedback between the power dissipated inside the chip and the temperature, which affects the circuit parameters and consequently the solutions is developed.