Refractive index evaluation of porous silicon using bragg reflectors

• D. Estrada-Wiese ^[1] ; J.A. del Río ^[2]
  1. [1] Universidad Autónoma del Estado de Morelos

     Universidad Autónoma del Estado de Morelos

     México

     
  2. [2] Universidad Nacional Autónoma de México

     Universidad Nacional Autónoma de México

     México

     
• Localización: Revista Mexicana de Física, ISSN-e 0035-001X, Vol. 64, Nº. 1, 2018, págs. 72-81
• Idioma: inglés
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• Resumen

  • There are two main physical properties needed to fabricate 1D photonic structures and form perfect photonic bandgaps: the quality of the thickness periodicity and the refractive index of their components. Porous silicon (PS) is a nano-structured material widely used to prepare 1D photonic crystals due to the ease of tuning its porosity and its refractive index by changing the fabrication conditions. Since the morphology of PS changes with porosity, the determination of PS’s refractive index is no easy task. To find the optical properties of PS we can use different effective medium approximations (EMA). In this work we propose a method to evaluate the performance of the refractive index of PS layers to build photonic Bragg reflectors. Through a quality factor we measure the agreement between theory and experiment and therein propose a simple procedure to determine the usability of the refractive indices. We test the obtained refractive indices in more complicated structures, such as a broadband Vis-NIR mirror, and by means of a Merit function we find a good agreement between theory and experiment. With this study we have proposed quantitative parameters to evaluate the refractive index for PS Bragg reflectors. This procedure could have an impact on the design and fabrication of 1D photonic structures for different applications.