Stability of miniaturized non-trimmed thick- and thin-film resistors

• Autores: Tibor Rovensky, Alena Pietrikova, Igor Vehec, Lubomir Livovsky
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 84, 2018, págs. 88-94
• Idioma: inglés
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• Resumen

  • This paper is focused on reliability tests of non-trimmed miniaturized thin-film and thick-film resistors. Thick-film resistors are screen printed by polymer paste on LTCC (Low Temperature Co-fired Ceramic) substrate by two different approaches. Nonstandard precise screen printing process provide tolerance of resistivity less than 5% and thus further trimming is not necessary. OhmegaPly material with Nickel Phosphorous (NiP) metal alloy is used for thin-film resistors fabricated by subtractive process. Miniaturized resistors have dimensions 0.5 × 0.5 mm, and thus 1 square, with thickness 1 μm for thin-film and 20 μm for thick-film resistors. Stability of miniaturized resistors were tested by humidity test, thermal shocks, long-term thermal ageing, direct current stress, current pulses and simulation of soldering process using VPS (Vapour Phase Soldering). Resistivity of resistors is measured by four wire method before and after each set of test and relative change of resistivity is plotted in graphs. Influence of every test on each type of resistor is analysed.