On the adoption of MC/DC and control-flow adequacy for a tight integration of program testing and statistical fault localization

• Bo Jiang ^[1] ; Ke Zhai ^[2] ; W.K. Chan ^[3] ; T.H. Tse ^[2] ; Zhenyu Zhang ^[4]
  1. [1] Beihang University

     Beihang University

     China

     
  2. [2] University of Hong Kong

     University of Hong Kong

     RAE de Hong Kong (China)

     
  3. [3] City University of Hong Kong

     City University of Hong Kong

     RAE de Hong Kong (China)

     
  4. [4] Chinese Academy of Sciences

     Chinese Academy of Sciences

     China

     

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• Localización: Information and software technology, ISSN 0950-5849, Vol. 55, Nº 5, 2013, págs. 897-917
• Idioma: inglés
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