Voltage oscillations during surge pulses induced by self-extinguishing non-destructive second breakdown in pn-junction diodes

• Autores: Steffen Holland, Rolf Brenner
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 88-90, 2018, págs. 208-213
• Idioma: inglés
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• Resumen

  • PN-junction diodes with different breakdown voltages have been subjected to surge pulses per the standard IEC 61000-4-5 and their transient behaviour has been studied. For medium breakdown voltages (20–40 V) at high surge currents large transient oscillations in the voltage drop across the diodes are observed. After such an event, the devices are still operational. 3D electro-thermal TCAD simulations have been done to understand the phenomenon. A comparison between measurement and simulation reveals that the periodic voltage drop is caused by non-destructive second breakdown.