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A method to obtain orientation curves in Euler space for a second diffraction process in polycrystals

    1. [1] Instituto Politécnico Nacional

      Instituto Politécnico Nacional

      México

  • Localización: Revista Mexicana de Física, ISSN-e 0035-001X, Vol. 64, Nº. 4, 2018, págs. 375-380
  • Idioma: inglés
  • Enlaces
  • Resumen
    • A method is presented to obtain the orientation curve in the Eulerian space, of crystallites which diffract in one point of a Debye-Scherer ring in a second diffraction process. The incident beam is therefore the reflected beam of a previous diffraction process, and the sample has a general orientation for a pole figure measurement, given as usual by two angles, χ around the sample Y axis, and ϕ around the sample normal. Two solutions are found for all secondary reflections. The method proposed here was outlined somewhere else for the measurement of pole figures by neutron diffraction [1], and here important improvements are made, especially regarding the mathematical methods.


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