A statistical pattern based feature extraction method on system call traces for anomaly detection

• Zhen Liu ^[1] ; Nathalie Japkowicz ^[2] ; Ruoyu Wang ^[3] ; Yongming Cai ^[1] ; Deyu Tang ^[1] ; Xianfa Cai ^[1]
  1. [1] Guangdong Pharmaceutical University

     Guangdong Pharmaceutical University

     China

     
  2. [2] American University

     American University

     Estados Unidos

     
  3. [3] South China University of Technology

     South China University of Technology

     China

     

  Mostrar afiliaciones +
• Localización: Information and software technology, ISSN 0950-5849, Nº 126, 2020, págs. 1-13
• Idioma: inglés
• Enlaces
  • Texto completo