Technometrics: A journal of statistics for the physical, chemical and engineering sciences

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  Año 2000, Vol. 42, Número 2

  • A Class of Three-Level Experimental Designs for Response Surface Modeling.

    Max D. Morris

    pág. 111

    

  • Semifolding 2... Designs.

    Robert W. Mee, Marta Peralta

    pág. 122

    

  • Comparisons of Approximate Confidence Interval Procedures for Type I Censored Data.

    William Q. Meeker

    pág. 135

    

  • Practical Small-Sample Asymptotics for Distributions Used in Life-Data Analysis.

    Augustine C. M. Wong, J. Wu

    pág. 149

    

  • Practical Aspects of Corrected Likelihood Ratio Confidence Intervals: A Discussion of Jeng-Meeker and Wong-Wu.: A Discussion of Jeng-Meeker and Wong-Wu.

    Necip Doganaksoy, Josef Schmee

    pág. 156

    

  • Progressively Censored Reliability Sampling Plans for the Weibull Distribution.

    Uditha BALASOORIYA, Sutaip L.C. SAW, Veeresh Gadag

    pág. 160

    

  • Development of Robust Multivariate Calibration Models.

    Edward V. Thomas, Nanxiang Ge

    pág. 168

    

  • Statistical Process Control Using Two Measurement Systems.

    Stefan H. Steiner

    pág. 178

    

  • Run-Related Probability Functions Applied to Sampling Inspection.

    Galit Shmueli, Ayala Cohen

    pág. 188

    

  • Book Reviews.

    Kimberly Vukovinsky

    pág. 204

    

  • Book Reviews.

    Joseph Conklin, Mark Carpenter

    pág. 205

    

  • Book Reviews.

    Lora Zimmer

    pág. 206

    

  • Book Reviews.

    Gordon Johnston, Paul A. Tobias

    pág. 207

    

  • Book Reviews.

    John V. Grice

    pág. 208

    

  • Book Reviews.

    David Sartori, Ronald D. Fricker Jr.

    pág. 209

    

  • Book Reviews.

    Peter Bajorski

    pág. 210

    

  • Book Reviews.

    Peihua Qiu, Margaret A. Nemeth, Hal W. Stephenson

    pág. 211

    

  • Book Reviews.

    Ranjan Maitra, Thomas Mathew

    pág. 212

    

  • Book Reviews.

    David E. Booth

    pág. 213

    

  • Book Reviews.

    Mark Von Tress, Errol Caby, Kenny Q. Ye

    pág. 214

    

  • Book Reviews.

    Debashis Kushary, Lynn Kuo

    pág. 216

    

  • Book Reviews.

    Gerald Shea, Philip H. Ramsey

    pág. 217

    

  • Book Reviews.

    A. Dale Magoun, Mark A. McComb

    pág. 218