Quality control and applied statistics

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  Año 2006, Vol. 51, Número 6

  • The RL2 chart versus the np chart for detecting upward shifts in fraction defective

    Patrick D Bourke

    págs. 601-602

    

  • The random intrinsic fast initial response of one-sided: CUSUM charts

    Alberto Luceño Vázquez, Jaime Puig-Pey Echebeste

    págs. 603-604

    

  • Attribute selection based on rough set theory for electromagnetic interference (EMI) fault diagnosis

    Cheng-Lung Huang, Te-She ng Li, Ting Kuo Peng

    págs. 605-606

    

  • Lot streaming for quality control in two-stage batchproduction

    Raymond G Vickson, Elkafi Hassini

    págs. 607-610

    

  • A Bayesian analysis of the Deming cost model with normally distributed sampling data

    Chiah-Cheng Chyu, I-Chung Yu

    págs. 611-612

    

  • Acceptance sampling? The enterprise strikes back!: AS9100 c = 0 plans; when slogans supplant science

    Joe Maciulla

    págs. 613-614

    

  • Adaptive sampling for Bayesian variable selection

    David J Nott, Robert Kohn

    págs. 615-620

    

  • Average outgoing quality of CSP-C continuous sampling plan under short run production processes

    S Balamurali, Chi-Hyuck Jun

    págs. 621-622

    

  • Does weighting for nonresponse increase the variance of survey means?

    Roderick J.A. Little, Sonya Vartivarian

    págs. 623-626

    

  • Hot deck imputation for the response model

    Jae Kwang Kim, Wayne A Fuller

    págs. 627-632

    

  • A Bayesian method of sample size determination with practical applications

    S K Sahu, T M F Smith

    págs. 633-634

    

  • Evolution of quality: First fifty issues of Production and Operations Management

    Roger G Schroeder, Kev in Linderman, Dongli Zhang

    págs. 635-636

    

  • New standard guides internal and supplier audits

    Gary L. Johnson

    págs. 637-638

    

  • Organizational learning curves for customer dissatisfaction: Heterogeneity across airlines

    Michael A. Lapré, Nikos Tsikriktsis

    págs. 639-642

    

  • Selection of good populations and related confidence intervals using sample quasi-ranges

    Parminder Singh, Amar Na th Gill, Satya N Mishra

    págs. 643-648

    

  • Fuzzy and randomized confidence intervals and P-values

    Charles J Geyer, Glen D. Meeden

    págs. 649-654

    

  • Confidence intervals for prediction intervals

    Rand R Wilcox

    págs. 655-658

    

  • Variance estimation with hot deck imputation simulation study of three methods

    J. Michael Brick, Michael E Jones, Graham Kalton, Richard Valliant

    págs. 659-662

    

  • Identifying need for new factors in EVOP

    A. Erhan Mergen, Donald. S. Holmes

    págs. 663-664

    

  • A nonparametric procedure for the analysis of balanced crossover designs

    Serge Tardif, Franco is Bellavance, Constance van Eeden

    págs. 665-666

    

  • Shape-based retrieval in time-series databases

    Sang-Wook Kim, Jeeh ee Yoon, Sang hyun Park, Jung Im Won

    págs. 667-668

    

  • Generalized two-sample U-statistics for clustered data

    Mei-Ling Ting Lee, Herold Dehling

    págs. 669-672

    

  • Detect financial problems with Six Sigma

    Deniz Senturk, Christi na Lacomb, Radu Neagu, Murat Doganaksoy

    págs. 673-676

    

  • A model of Web site quality assessment

    Vassilis Moustakis, Louk as Tsironis, Charalampos Litos

    págs. 677-678

    

  • A robust calibration methodology for an on-board diagnostic car system

    Pasquale Erto, Biag io Palumbo, Stefano Barone

    págs. 679-680

    

  • Process optimization for the improvement of brake noise: A case study

    Hee Seong Sohn, Tae Won Park

    págs. 681-684

    

  • The relationship between service quality and customer: The example of CJCU library

    Chich-Jen Shieh, Ming Wang

    págs. 685-686

    

  • 600 APPLICATIONS - Using signed distance and order statistics method for fuzzy: Evaluation of service quality

    Tien-Tsai Huang, Wen-Tao Huang

    págs. 687-688

    

  • Calibration, error analysis, and ongoing measurement process monitoring for mass spectrometry

    Stephen B Vardeman

    págs. 689-690

    

  • Competing failure modes in accelerated life testing

    C Bunea, T A Mazzuchi

    págs. 691-692