Technometrics: A journal of statistics for the physical, chemical and engineering sciences

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  Año 2014, Vol. 56, Número 4

  • An Efficient Screening Method for Computer Experiments.

    Alexis Boukouvalas, John Paul Gosling, Hugo Maruri-Aguilar

    págs. 422-431

    

  • A D-Optimal Design for Estimation of Parameters of an Exponential-Linear Growth curve of Nanostructures.

    Li Zhu, Tirthankar Dasgupta, Qiang Huang

    págs. 432-442

    

  • Convex Combination of Gaussian Processes for Vayesian Analysis of Deterministic Computer Experiments.

    Ofir Harari, David M. Steinberg

    págs. 443-454

    

  • Fast Parallel Kriging-Based Stepwise Uncertainty Reduction With Application to the Identification of an Excursion Set.

    Clément Chevalier, Julien Bect, David Ginsbourger, Emmanuel Vazquez, Victor Picheny, Yann Richet

    págs. 455-465

    

  • Building Accurate Emulators for Stochastic Simulations via Quantile Kriging.

    Matthew Plumlee, Rui Tuo

    págs. 466-473

    

  • Model Calibration Through Minimal Adjustments.

    Chia-Jung Chang, Roshan Joseph Vengazhiyil

    págs. 474-482

    

  • Restricted Likelihood Ratio Test for Functional Effects in the Functional Linear Model.

    Bruce J. Swihart, Jeff Goldsmith, Ciprian M. Crainiceanu

    págs. 483-493

    

  • Multivariate exponential smoothing and dynamic factor model applied to hourly electricity price analysis.

    Jaime Carpio, Jesús Juan, Damián López Rodríguez

    págs. 494-503

    

  • Semiparametric Estimation of Gamma Processes for Deteriorating Products.

    Zhi-Sheng Ye, Min Xie, Loon-Ching Tang, Nan Chen

    págs. 504-513

    

  • Efficient Sequential Monte Carlo Sampling for Continuous Monitoring of a Radiation Situation.

    Václav Smídl, Radek Hofman

    págs. 514-527

    

  • A Distribution-Free Multivariate Phase I Location Control Chart for Subgrouped Data from Elliptical Distributions.

    Richard C. Jr. Bell, L. Allison Jones-Farmer, Nedret Billor

    págs. 528-538

    

  • Jump Detection in Blurred Regression Surfaces.

    Yicheng Kang, Peihua Qiu

    págs. 539-550