Fast Parallel Kriging-Based Stepwise Uncertainty Reduction With Application to the Identification of an Excursion Set.

• Autores: Clément Chevalier, Julien Bect, David Ginsbourger, Emmanuel Vazquez, Victor Picheny, Yann Richet
• Localización: Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 56, Nº. 4, 2014, págs. 455-465
• Idioma: inglés
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