Microelectronics reliability

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  Año 2018, Número 85

  • Effect of aging on mechanical properties of high temperature Pb-rich solder joints

    G. Khatibi, A. Betzwar-Kotas, M. Lederer

    • Resumen

    págs. 1-11

    

  • Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode

    Josef Hylský, Dávid Strachala, Petr Vyroubal, Pavel Čudek, Jiří Vaněk, Petr Vanýsek

    • Resumen

    págs. 12-18

    

  • Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test

    Junji Sakamoto, Ryoma Hirata, Tadahiro Shibutani

    • Resumen

    págs. 19-24

    

  • Strategy for enhancing reliability and lifetime of DC-AC inverters used for wind turbines

    C. Batunlu, A. Albarbar

    • Resumen

    págs. 25-37

    

  • Failure mode analysis of MEMS suspended inductors under mechanical shock

    Yiyuan Li, Jianhua Li, Lixin Xu

    • Resumen

    págs. 38-48

    

  • Comphy — A compact-physics framework for unified modeling of BTI

    G. Rzepa, J. Franco, B. O’Sullivan, A. Subirats, M. Simicic, Geert Hellings, P. Weckx, M. Jech, T. Knobloch, M. Waltl, P.J. Roussel, D. Linten, B. Kaczer, T. Grasser

    • Resumen

    págs. 49-65

    

  • Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length

    Junyeap Kim, Hanbin Yoo, Heesung Lee, Seong Kwang Kim, Sungju Choi, Sung-Jin Choi, Dae Hwan Kim, Dong Myong Kim

    • Resumen

    págs. 66-70

    

  • Specification analysis of the deteriorating sensor for required lifetime prognostic performance

    Jian-Xun Zhang, Xiao-Sheng Si, Dang-Bo Du, Chang-Hua Hu

    • Resumen

    págs. 71-83

    

  • Towards the CFD model of flow rate dependent enzyme-substrate reactions in nanoparticle filled flow microreactors

    Péter Pálovics, Ferenc Ender, Marta Rencz

    • Resumen

    págs. 84-92

    

  • Sub-1 ns characterization methodology for transistor electrical parameter extraction

    Yiming Qu, Bing Chen, Wei Liu, Jinghui Han, Jiwu Lu, Yi Zhao

    • Resumen

    págs. 93-98

    

  • A novel prediction method based on the support vector regression for the remaining useful life of lithium-ion batteries

    Qi Zhao, Xiaoli Qin, Hongbo Zhao, Wenquan Feng

    • Resumen

    págs. 99-108

    

  • Design, manufacture and test for reliable 3D printed electronics packaging

    Tim Tilford, Stoyan Stoyanov, Jessica Braun, Jan Christoph Janhsen, Matthias Burgard, Richard Birch, Chris Bailey

    • Resumen

    págs. 109-117

    

  • A reverse hysteresis effect of graphene transistors with amorphous silicon gate dielectric

    Qingwei Zhang, Ping Li, Yongbo Liao, Gang Wang, Rongzhou Zeng, Heng Wang

    • Resumen

    págs. 118-121

    

  • Zero-maintenance of electronic systems: Perspectives, challenges, and opportunities

    Richard McWilliam, Samir Khan, Michael Farnsworth, Colin Bell

    • Resumen

    págs. 122-139

    

  • The influence of microwave pulse width on the thermal burnout effect of an LNA constructed by a GaAs PHEMT

    Shipeng Yi, Zhengwei Du

    • Resumen

    págs. 140-147

    

  • Stable reduced order modeling of piezoelectric energy harvesting modules using implicit Schur complement

    S. Hu, C. Yuan, A. Castagnotto, Boris Lohmann, S. Bouhedma, D. Hohlfeld, T. Bechtold

    • Resumen

    págs. 148-155

    

  • The influence of microwave pulse repetition frequency on the thermal burnout effect of a PIN diode limiting-amplifying system

    Shipeng Yi, Zhengwei Du

    • Resumen

    págs. 156-162

    

  • Effect of voids on thermo-mechanical reliability of chip resistor solder joints: Experiment, modelling and simulation

    P. Wild, D. Lorenz, T. Grözinger, A. Zimmermann

    • Resumen

    págs. 163-175

    

  • Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes

    Jorge Loayza, Nicolas Guitard, Bruno Allard, Luong Viêt Phung, Blaise Jacquier, Philippe Galy

    • Resumen

    págs. 176-189

    

  • A cross-layer aging-aware task scheduling approach for multiprocessor embedded systems

    Masoomeh Karami, Athena Abdi, H.R. Zarandi

    • Resumen

    págs. 190-197

    

  • Vertical natural convection models and their effect on failure analysis in electro-thermal simulation of large-surface OLEDs

    László Pohl, Zsolt Kohári, András Poppe

    • Resumen

    págs. 198-206

    

  • A generalized degradation model based on Gaussian process

    Zhihua Wang, Qiong Wu, Xiongjian Zhang, Xinlei Wen, Yongbo Zhang, Chengrui Liu, Huimin Fu

    • Resumen

    págs. 207-214