Imaging detectors and electronics¿a view of the future
Helmuth Spieler
págs. 1-17
Compound semiconductor radiation detectors
A. Peacock, Alan Owens
págs. 18-37
págs. 38-51
The effect of carrier diffusion on the characteristics of semiconductor imaging arrays
J.K. Wigmore, A. Owens, A. Peacock, A.G. Kozorezov, R. den Hartog
págs. 52-55
3D detectors - a new direction for Medipix
A. Blue, I. Johnston, J. Melone, S. Nenonen, P. Roy, V.A. Wright, M. Horn, K. Smith, L. Lea, M. Rahman, E. Koskiahde, V. O'Shea
págs. 56-61
Simulation of signal generation processes in semiconductor sensor layers for Medipix1 and 2
G. Anton, M. Mitschke, J. Giersch
págs. 62-67
The influence of energy weighting on X-ray imaging quality
Jürgen Giersch, Daniel Niederlöhner, Gisela Anton
págs. 68-74
Intrinsic spatial resolution of semiconductor X-ray detectors: a simulation study
M. Hoheisel, J. Giersch, P. Bernhardt
págs. 75-81
Ion beam induced charge imaging of epitaxial GaN detectors
D. Hoxley, A. Simon, M. Rahman, J. Vaitkus, E. Gaubas, W. Cunningham, A. Lohstroh, P.J. Sellin
págs. 82-86
Multielement X-ray row detector on GaAs with spatial resolution of 108 ¿m
T.M. Panova, A.I. Krikunov, Yu.M. Dikaev, V.F. Dvoryankin, A.A. Telegin
págs. 87-88
X-ray imaging bilinear staggered GaAs detectors
A.I. Krikunov, T.M. Panova, A.A. Telegin, A.G. Petrov, G.G. Dvoryankina, Yu.M. Dikaev, A.A. Kudryashov, V.F. Dvoryankin, R.A. Achmadullin
págs. 89-91
págs. 92-96
X-ray and ¿-ray detectors based on GaAs epitaxial structures
S.M. Guschin, A.P. Vorobiev, L.S. Okaevich, O.G. Shmakov, V.P. Germogenov, O.P. Tolbanov, G.I. Ayzenshtat
págs. 97-102
Influence of top contact topology on detection properties of semi-insulating GaAs detectors
M. Seká¿ová, T. Ly Anh, A. Perd¿ochová, V. Ne&cbreve;as, F. Dubecký, P. Bohá&cbreve;ek, V. Pavlicová
págs. 103-110
On the spectrometric performance limit of radiation detectors based on semi-insulating GaAs
P. Frigeri, R. Mosca, V. Ne¿as, E. Gombia, A. Förster, B. Za¿ko, M. Seká¿ová, P. Bohá¿ek, S. Franchi, F. Dubecký, J. Huran, P. Kordo¿
págs. 111-120
GaAs detector material made from 3-inch wafers
O.B. Koretskaya, O.P. Tolbanov, A.V. Tyazhev, D.L. Budnitsky, D.Y. Mokeev, L.S. Okaevich, G.I. Ayzenshtat, V.A. Novikov
págs. 121-124
Spectroscopic response of a CdTe microstrip detector when irradiated at various impinging angles
W. Dusi, A. Raulo, S. Vitulli, E. Perillo, G. Ventura, A. Cola, A. Donati, G. Landini
págs. 125-133
H.-E. Nilsson, G. Thungström, C. Mattsson, K. Bertilsson
págs. 134-139
H. Andersson, A. Lundgren, H.-E. Nilsson, G. Thungström
págs. 140-146
Gamma-radiation dosimetry with semiconductor CdTe and CdZnTe detectors
V.E. Kutny, A.V. Rybka, I.M. Prokhoretz, L.N. Davydov, A.N. Orobinsky, D.V. Kutny, I.N. Shlyakhov
págs. 147-156
Influence of powerful laser irradiation on impurity-defect structure of CdTe detector material
I.M. Kupchak, P. Hlidek, A. Medvid¿, Yu.V. Kryuchenko, E.I. Kuznetsov, D.V. Korbutyak, S.G. Krylyuk, L.L. Fedorenko
págs. 157-160
págs. 161-164
TlBr crystal growth, purification and characterisation
T. Prohaska, H. Sipilä, V. A. Kozlov, M. Leskelä, G. Schultheis, G. Stingeder
págs. 165-173
Development of the technology for growing TlBr detector crystals
I.S. Lisitsky, M.S. Kouznetsov, S.I. Zatoloka, V.V. Gostilo
págs. 174-180
F. Dubecký, P.G. Pelfer, E. Gombia, J. Huran, R. Mosca, B. Za¿ko, V. ¿matko, P. Bohá¿ek, R. Fornari, M. Seká¿ová
págs. 181-191
Investigation of degradation of electrical and photoelectrical properties in TlBr crystals
J. Vaitkus, A. Mekys, S. Zatoloka, V. Gostilo, R. Jasinskaite, A. Zindulis, A. Owens
págs. 192-196
Optical investigations of TlBr detector crystals
I.S. Lisitskii, M.S. Kuznetsov, M. Shorohov, S. Zatoloka, V. Gostilo, L. Grigorjeva, D. Millers
págs. 197-201
High-density hybrid interconnect methodologies
Joachim John, Piet De Moor, Chris Van Hoof, Lars Zimmermann
págs. 202-208
X-ray energy selected imaging with Medipix II
J. Ludwig, K.-W. Benz, M. Fiederle, H. Braml, J.-P. Konrath, A. Zwerger, A. Fauler
págs. 209-214
Performance of a chip for hybrid pixel detectors with two counters for X-ray imaging
N. Bingefors, F. Edling, C. Rönnqvist, L. del Risco Norrlid, R. Brenner, K. Fransson, L. Gustafsson
págs. 215-220
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