Resumen de imultaneous Monitoring of Bias, Linearity, and Precision of Multiple, Measurement Gauges
A Shewhart charting scheme is investigated for simultaneous monitoring of multiple measuring gauges used for measuring a product or process attribute. This chart can identify any malfunctioning gauges that cause a shift in bias, linearity, or precision. An in-control state provides evidence that the gauges are functioning properly and are providing accurate measurements. The run length performance of the proposed chart is compared with that of a Shewhart charting scheme for measuring linearity between two measurement gauges. Applications of the proposed charting scheme are demonstrated with real manufacturing data sets.
