Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach

• Autores: S. Hairoud-Airieau, G. Duchamp, T. Dubois, J.-Y. Delétage, A. Durier, H. Frémont
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 674-679
• Idioma: inglés
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• Resumen

  • Abstract In this paper, we develop a conducted immunity model based on ICIM-CI approach (Integrated Circuit Immunity Model Conducted Immunity) that takes into account the effect of ageing in the immunity characteristics of a bandgap voltage reference. The modelling approach is briefly described. Then the measurement setup and the ageing procedure are detailed. Finally, the model is established and validated thanks to measurements before and after ageing. This model allows to anticipate the long term electromagnetic compliance of the circuit.