Investigations on the EFT immunity of microcontrollers with different architectures

• Autores: J. Wu, B. Li, W. Zhu, H. Wang, L. Zheng
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 708-713
• Idioma: inglés
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• Resumen

  • Abstract With the development of MCUs and the deterioration of the electromagnetic environment, it has led microcontroller unit (MCU) electromagnetic susceptibility (EMS) to transient burst interference to become the focus on academics and enterprises. Most electromagnetic compatibility (EMC) studies of MCUs have not taken into account the contrasting nature of differing architectures. Subsequently, different MCU architectures may possess varying physical parameters, often resulting in different susceptibility EMI outcomes. This paper shall focus on the relationship between MCU architectures and its EMC susceptibility. Upon close examination, test results have shown to exhibit variances in relation to the two types of MCU architectures with regards to susceptibility of electrical fast transients (EFT) burst. Consequently, the underlying reasons resulting in MCU susceptibility variations based on differing MCU architectures shall also be elaborated on further.