Ayuda
Ir al contenido

Dialnet


Resumen de Effects of Ozone pre-deposition treatment on GaSb MOS capacitors

Zhen Tan, Linfeng Zhaob, Ning Cui, Jing Wang, Jun Xu

  • GaSb metal-oxide-semiconductor capacitors (MOSCAPs) with Ozone pre-deposition treatment at various temperatures are studied. It is found that Ozone treatment can improve the characteristics of High-k/GaSb MOSCAPs. The Interface Trap Density (Dit) is reduced by 50% after Ozone pre-deposition treatment at 200°C, and gate leakage current is reduced by around 70% after Ozone treatment at 100°C.


Fundación Dialnet

Dialnet Plus

  • Más información sobre Dialnet Plus