Yili Hong

• Artículos de revistas (10)

• Artículos de revistas

  • Sequential Bayesian Design for Accelerated Life Tests

    I.-Chen Lee, Yili Hong, Sheng-Tsaing Tseng, Tirthankar Dasgupta

    Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 60, Nº. 4, 2018, págs. 472-483

    

  • Semiparametric Models for Accelerated Destructive Degradation Test Data Analysis

    Yimeng Xie, Caleb B. King, Yili Hong, Qingyu Yang

    Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 60, Nº. 2, 2018, págs. 222-234

    

  • A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data.

    Zhiting Xu, Yili Hong, William Q. Meeker, Brock E. Osborn, Kati Illouz

    Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 59, Nº. 2, 2017, págs. 225-236

    

  • Survival analysis of loblolly pine trees with spatially correlated random effects

    Jie Li, Yili Hong, Ram Thapa, Harold E. Burkhart

    Journal of the American Statistical Association, ISSN 0162-1459, Vol. 110, Nº 510, 2015, págs. 486-502

    • Resumen
    

  • Statistical Methods for Degradation Data With Dynamic Covariates Information and an Application to Outdoor Weathering Data.

    Yili Hong, Yuanyuan Duan, William Q. Meeker, Deborah L. Stanley, Xiaohong Gu

    Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 57, Nº. 2, 2015, págs. 180-193

    

  • Field-failure predictions based on failure-time data with dynamic covariate information

    Yili Hong, William Q. Meeker

    Quality control and applied statistics, ISSN 0033-5207, Vol. 59, Nº. 4, 2014, págs. 397-400

    

  • Field-Failure Predictions Based on Failure-Time Data With Dynamic Covariate Information.

    Yili Hong, William Q. Meeker

    Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 55, Nº. 2, 2013, págs. 135-149

    

  • Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information.

    Yili Hong, William Q. Meeker

    Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 52, Nº. 2, 2010, págs. 148-159

    

  • Using Accelerated Life Tests Results to Predict Product Field Reliability.

    William Q. Meeker, Luis A. Escobar, Yili Hong

    Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 51, Nº. 2, 2009, págs. 146-161

    

  • Avoiding Problems With Normal Approximation Confidence Intervals for probabilities.

    Yili Hong, William Q. Meeker, Luis A. Escobar

    Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 1, 2008, págs. 64-68

    

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