Periodo de publicación recogido
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Sequential Bayesian Design for Accelerated Life Tests
I.-Chen Lee, Yili Hong, Sheng-Tsaing Tseng, Tirthankar Dasgupta
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 60, Nº. 4, 2018, págs. 472-483
Semiparametric Models for Accelerated Destructive Degradation Test Data Analysis
Yimeng Xie, Caleb B. King, Yili Hong, Qingyu Yang
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 60, Nº. 2, 2018, págs. 222-234
A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data.
Zhiting Xu, Yili Hong, William Q. Meeker, Brock E. Osborn, Kati Illouz
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 59, Nº. 2, 2017, págs. 225-236
Survival analysis of loblolly pine trees with spatially correlated random effects
Jie Li, Yili Hong, Ram Thapa, Harold E. Burkhart
Journal of the American Statistical Association, ISSN 0162-1459, Vol. 110, Nº 510, 2015, págs. 486-502
Yili Hong, Yuanyuan Duan, William Q. Meeker, Deborah L. Stanley, Xiaohong Gu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 57, Nº. 2, 2015, págs. 180-193
Field-failure predictions based on failure-time data with dynamic covariate information
Yili Hong, William Q. Meeker
Quality control and applied statistics, ISSN 0033-5207, Vol. 59, Nº. 4, 2014, págs. 397-400
Field-Failure Predictions Based on Failure-Time Data With Dynamic Covariate Information.
Yili Hong, William Q. Meeker
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 55, Nº. 2, 2013, págs. 135-149
Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information.
Yili Hong, William Q. Meeker
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 52, Nº. 2, 2010, págs. 148-159
Using Accelerated Life Tests Results to Predict Product Field Reliability.
William Q. Meeker, Luis A. Escobar, Yili Hong
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 51, Nº. 2, 2009, págs. 146-161
Avoiding Problems With Normal Approximation Confidence Intervals for probabilities.
Yili Hong, William Q. Meeker, Luis A. Escobar
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 1, 2008, págs. 64-68
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