Periodo de publicación recogido
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A Hierarchical Model for Heterogenous Reliability Field Data
Eric Mittman, Colin Lewis Beck, William Q. Meeker
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 61, Nº. 3, 2019, págs. 354-368
Wei Zhang, Ye Tian, Luis A. Escobar, William Q. Meeker
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 59, Nº. 2, 2017, págs. 202-214
A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data.
Zhiting Xu, Yili Hong, William Q. Meeker, Brock E. Osborn, Kati Illouz
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 59, Nº. 2, 2017, págs. 225-236
A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images.
Ye Tian, Ranjan Maitra, William Q. Meeker, Stephen D. Holland
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 59, Nº. 2, 2017, págs. 247-261
Statistical Methods for Estimating the Minimum Thickness Along a Pipeline.
Shiyao Liu, William Q. Meeker
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 57, Nº. 2, 2015, págs. 164-179
Yili Hong, Yuanyuan Duan, William Q. Meeker, Deborah L. Stanley, Xiaohong Gu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 57, Nº. 2, 2015, págs. 180-193
More pitfalls of accelerated tests
William Q. Meeker, Georgios Sarakakis, Athanasios Gerokostopoulos
Quality control and applied statistics, ISSN 0033-5207, Vol. 59, Nº. 4, 2014, págs. 349-352
Field-failure predictions based on failure-time data with dynamic covariate information
Yili Hong, William Q. Meeker
Quality control and applied statistics, ISSN 0033-5207, Vol. 59, Nº. 4, 2014, págs. 397-400
Methods for planning repeated measures degradation studies
Brian P. Weaver, Joanne Wendelberger, Luis A. Escobar, William Q. Meeker
Quality control and applied statistics, ISSN 0033-5207, Vol. 59, Nº. 3, 2014, págs. 243-246
Ming Li, William Q. Meeker, R. Bruce Thompson
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 56, Nº. 1, 2014, págs. 78-91
Methods for Planning Repeated Measures Degradation Studies.
Brian P. Weaver, William Q. Meeker, Luis A. Escobar, Joanne Wendelberger
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 55, Nº. 2, 2013, págs. 122-134
Field-Failure Predictions Based on Failure-Time Data With Dynamic Covariate Information.
Yili Hong, William Q. Meeker
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 55, Nº. 2, 2013, págs. 135-149
A comparison of maximum liklihood and median-rank regression for Weibull estimation
Ulrike Genschel, William Q. Meeker
Quality control and applied statistics, ISSN 0033-5207, Vol. 56, Nº. 1-2, 2011, págs. 115-116
Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information.
Yili Hong, William Q. Meeker
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 52, Nº. 2, 2010, págs. 148-159
Using Accelerated Life Tests Results to Predict Product Field Reliability.
William Q. Meeker, Luis A. Escobar, Yili Hong
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 51, Nº. 2, 2009, págs. 146-161
Accelerated Destructive Degradation Test Planning.
Ying Shi, Luis A. Escobar, William Q. Meeker
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 51, Nº. 1, 2009, págs. 1-13
The future of Industrial Statistics. A Panel Discussion.
David M. Steinberg, Soren Bisgaard, Necip Doganaksoy, Nicholas I. Fisher, Bert Gunter, Gerald Hahn, Sallie Keller-McNulty, Jon Kettenring, William Q. Meeker, Douglas C. Montgomery, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 2, 2008, págs. 103-127
Analysis Of Window-Observation Recurrence Data.
Jianying Zuo, William Q. Meeker, Huaiqing Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 2, 2008, págs. 128-143
Avoiding Problems With Normal Approximation Confidence Intervals for probabilities.
Yili Hong, William Q. Meeker, Luis A. Escobar
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 1, 2008, págs. 64-68
Scott W McKane, Luis A. Escobar, William Q. Meeker
Quality control and applied statistics, ISSN 0033-5207, Vol. 51, Nº. 2, 2006, págs. 163-166
A Review of Accelerated Test Models.
Luis A. Escobar, William Q. Meeker
Statistical science, ISSN 0883-4237, Nº. 4, 2006, págs. 552-577
Conceptos de fiabilidad y análisis de datos
Necip Doganaksoy, Luis A. Escobar, Gerald J. Hahn, William Q. Meeker
Manual de calidad de Juran / coord. por Joseph M. Juran, A. Blanton Godfrey, Vol. 2, 2001, ISBN 84-481-3282-3, pág. 48
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