Periodo de publicación recogido
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Analysis-of-Marginal-Tail-Means (ATM): A Robust Method for Discrete Black-Box Optimization
Simon Mak, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 61, Nº. 4, 2019, págs. 545-559
Ray-Bing Chen, Weichung Wang, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 59, Nº. 2, 2017, págs. 139-152
Optimization of Multi-Fidelity Computer Experiments via the EQIE Criterion.
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 59, Nº. 1, 2017, págs. 58-68
Post-fisherian experimentation: : From physical to virtual
C.F. Jeff Wu
Journal of the American Statistical Association, ISSN 0162-1459, Vol. 110, Nº 510, 2015, págs. 612-620
Sequential Exploration of Complex Surfaces Using Minimum Energy Designs.
Roshan Joseph Vengazhiyil, Tirthankar Dasgupta, Rui Tuo, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 57, Nº. 1, 2015, págs. 64-74
Surrogate Modeling of Computer Experiments With Different Mesh Densities.
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 56, Nº. 3, 2014, págs. 372-380
Comment: Alternative Strategies for Experimental Design.
Matthew Plumlee, Roshan Joseph Vengazhiyil, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 55, Nº. 3, 2013, págs. 289-291
Matthias H. Y. Tan, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 55, Nº. 3, 2013, págs. 359-372
Sequenctial Design and Analysis of High-Accuracy and Low-Accuracy Computer Codes.
Shifeng Xiong, Peter Z.G. Qian, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 55, Nº. 1, 2013, págs. 37-46
Robust Design Optimization With Quadratic Loss Derived From Gaussian Process Models.
Matthias H. Y. Tan, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 54, Nº. 1, 2012, págs. 51-63
Robust design measurement systems
Tirthankar Dasgupta, Arden Miller, C.F. Jeff Wu
Quality control and applied statistics, ISSN 0033-5207, Vol. 56, Nº. 1-2, 2011, págs. 145-146
Robust Design of Measurement Systems.
Tirthankar Dasgupta, Arden Miller, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 52, Nº. 1, 2010, págs. 80-93
Binary time series modeling with application to adhesion frequency experiments
Ying Hung, Veronika Zarnitsyna, Yan Zhang, Cheng Zhu, C.F. Jeff Wu
Journal of the American Statistical Association, ISSN 0162-1459, Vol. 103, Nº 483, 2008
Gaussian Process Models for Computer Experiments With Qualitative and Quantitative Factors.
Peter Z.G. Qian, Huaiqing Wu, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 3, 2008, págs. 383-396
The future of Industrial Statistics. A Panel Discussion.
David M. Steinberg, Soren Bisgaard, Necip Doganaksoy, Nicholas I. Fisher, Bert Gunter, Gerald Hahn, Sallie Keller-McNulty, Jon Kettenring, William Q. Meeker, Douglas C. Montgomery, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 2, 2008, págs. 103-127
Bayesian Hierarchical Modeling for Integrating Low-Accuracy and High-Accuracy Experiments.
Peter Z.G. Qian, C.F. Jeff Wu
Technometrics: A journal of statistics for the physical, chemical and engineering sciences, ISSN 0040-1706, Vol. 50, Nº. 2, 2008, págs. 192-204
Robust parameter design with feedback control
Tirthankar Dasgupta, C.F. Jeff Wu
Quality control and applied statistics, ISSN 0033-5207, Vol. 52, Nº. 4, 2007, págs. 441-442
Operating window experiments: A novel approach to quality improvement
V Roshan Joseph, C.F. Jeff Wu
Quality control and applied statistics, ISSN 0033-5207, Vol. 48, Nº. 6, 2003, págs. 665-668
Economical experimentation methods for robust design
Anne C. Shoemaker, Kwok-Leung Tsui, C.F. Jeff Wu
Quality control and applied statistics, ISSN 0033-5207, Vol. 37, Nº. 3, 1992, págs. 145-146
A critical look at accumulation analysis and related methods
M Hamada, C.F. Jeff Wu
Quality control and applied statistics, ISSN 0033-5207, Vol. 36, Nº. 7, 1991, págs. 419-420
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