Optical interaction in active analog circuit elements

• Autores: I. Vogt, T. Nakamura, C. Boit
• Localización: Microelectronics reliability, ISSN 0026-2714, Nº. 76-77, 2017, págs. 233-237
• Idioma: inglés
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• Resumen

  • Abstract This publication introduces (spectral) photon emission (PEM) and electro-optical frequency mapping (EOFM/LVI) measurements to analog circuit elements (simple, cascode and low-voltage current mirrors). Different operating conditions of the devices are probed and the voltage dependence of the signals is analyzed. Results partly show close similarities to optical probing of digital IC's, but also differences in voltage dependence and signal levels due to more complicated voltage and signal distributions along the devices.