Resumen de Single-event multiple transients in guard-ring hardened inverter chains of different layout designs
Wen Zhao, Chaohui He, Wei Chen, Rongmei Chen, Peitian Cong, Fengqi Zhang, Zujun Wang, Chen Shen, Lisang Zheng, Xiaoqiang Guo, Lili Ding
Single-event multiple transients (SEMTs) measurement based on an on-chip self-triggered method is performed. Measurement results for guard-ring hardened inverter chains of two layout designs, including a source/drain sharing design and a conventional design, are compared under pulsed laser irradiation. Pulsed laser exposures with different energies show that the guard-ring hardened inverter chain with a source/drain sharing design is more sensitive to single-event double transients (SEDTs). It is found that SEDTs with small temporal differences can be merged into single-event single transients (SESTs) thanks to the pulse broadening effect. A layout-hardened design for SEDTs in the guard-ring hardened inverter chain is also suggested.
