Y. Lu

• Artículos de revistas (17)

• Artículos de revistas

  • A novel error compensation implementing strategy and realizing on Siemens 840D CNC systems.

    G.W. Cui, Y. Lu, D. Gao, Y.X. Yao

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 61, Nº. 5-8, 2012, págs. 595-608

    

  • A new approach to thermally induced volumetric error compensation.

    Y. Lu, M.N. Islam

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 62, Nº. 9-12, 2012, págs. 1071-1086

    

  • Tool-path generation for sheet metal incremental forming based on STL model with defects.

    M. Li, L.-C. Zhang, J.-H. Mo, Y. Lu

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 63, Nº. 5-8, 2012, págs. 535-547

    

  • Geometric error compensation software system for CNC machine tools based on NC program reconstructing.

    G. Cui, Y. Lu, J. Li, D. Gao, Yingxue Yao

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 63, Nº. 1-4, 2012, págs. 169-180

    

  • A remote CAE collaborative design system for complex product based on design resource unit.

    J. Yu, J. Cha, Y. Lu, Y. Zhuang

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 53, Nº. 9-12, 2011, págs. 855-866

    

  • Experimental investigation on monitoring interelectrode gap of ECM with six-axis force sensor.

    Y. Lu, K. Liu, D. Zhao

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 55, Nº. 5-8, 2011, págs. 565-572

    

  • Simulation of pre-solving active forces of a 4SPS+SPR parallel machine tool in normal machining a 3D free-form surface.

    Y. Lu, J. Xu, J. Yu

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 46, Nº. 1-4, 2010, págs. 21-30

    

  • Using colored Petri nets to model and analyze workflow with separation of duty constraints.

    Y. Lu, L. Zhang, J. Sun

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 40, Nº. 1-2, 2009, págs. 179-192

    

  • Simulation solving/modifying velocity and acceleration of a 4UPS+SPR type parallel machine tool during normal machining of a 3D free-form surface.

    Y. Lu, J. Xu

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 42, Nº. 7-8, 2009, págs. 804-812

    

  • Complex nonlinear behaviors of drilling shaft system in boring and trepanning association deep hole drilling.

    L. Kong, Y. Li, Y. Lu, D. Li

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 45, Nº. 3-4, 2009, págs. 211-218

    

  • Kinematics analysis and solution of the active/passive forces of a 4SPS+SPR parallel machine tool.

    Y. Lu, B. Hu, J.-Y. Xu

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 36, Nº. 1-2, 2008, págs. 178-187

    

  • Simulation of machining 3D free-form surface in normal direction using 6-SSP and 4SPS+UPU parallel machine tools.

    Y. Lu

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 33, Nº. 11-12, 2007, págs. 1180-1188

    

  • Computer simulation machining a 3D free surface by using a 3-RPRU parallel machine tool.

    Y. Lu, J. Xu

    International journal of advanced manufacturing technology, ISSN 0268-3768, Vol. 33, Nº. 7-8, 2007, págs. 782-792

    

  • Electrical and structural properties of hafnium silicate thin films.

    I.Z. Mitrovic, O. Buiu, S. Hall, C. Bungey, T. Wagner, W. Davey, Y. Lu

    Microelectronics reliability, ISSN 0026-2714, Vol. 47, Nº. 4-5, 2007, págs. 645-648

    

  • Charge trapping and interface states in hydrogen annealed HfO2¿Si structures.

    Y.V. Gomeniuk, A.N. Nazarov, Ya.N. Vovk, V.S. Lysenko, Y. Lu, O. Buiu, S. Hall, R.J. Potter, P. Chalker

    Microelectronics reliability, ISSN 0026-2714, Vol. 47, Nº. 4-5, 2007, págs. 714-717

    

  • Tuneable electrical properties of hafnium aluminate gate dielectrics deposited by metal organic chemical vapour deposition.

    Y. Lu, O. Buiu, S. Hall, I.Z. Mitrovic, W. Davey, R.J. Potter, P.R. Chalker

    Microelectronics reliability, ISSN 0026-2714, Vol. 47, Nº. 4-5, 2007, págs. 722-725

    

  • Charge trapping characterization of MOCVD HfO2/p-Si interfaces at cryogenic temperatures.

    I.P. Tyagulskyy, I.N. Osiyuk, V.S. Lysenko, A.N. Nazarov, S. Hall, O. Buiu, Y. Lu, R. Potter, P.R. Chalker

    Microelectronics reliability, ISSN 0026-2714, Vol. 47, Nº. 4-5, 2007, págs. 726-728

    

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