IEICE transactions on information and systems

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  Año 1998, Vol. 81, Número 7

  • High-Level Synthesis for Weakly Testable Data Paths

    M. Inoue

    págs. 645-653

    

  • Improving Random Patters Testability with Partial Circuit Duplication Approach

    H. Yokoyama, Xiaoqing Wen, H. Tamamoto

    págs. 654-659

    

  • Partial Scan Design Methods Based on n-Fold Line-up Structures and the State Justification of Pure Load/Hold Flip-Flops

    T. Hosokawa

    págs. 660-667

    

  • On Acceleration of Test Points Selection for Scan-Based BIST

    M. Nakao, K. Hatayama, I. Higashi

    págs. 668-674

    

  • Cellular Automata Implementation of TPG Circuits for Built-In Two-Pattern Testing

    K. Furuya, Naoki Nakamura

    págs. 675-681

    

  • An Iterative Improvement Method for Gerenating Compact Tests for IDDQ Testing of Bridging Faults

    T. Shinogi, T. Hayashi

    págs. 682-688

    

  • Test Generation for Sequential Circuits under IDDQ Testing

    Taro Maeda, Yoshinobu Higami, K. Kinosita

    págs. 689-696

    

  • Transistor Leakage Fault Diagnosis for CMOS Circuits

    Xiaoqing Wen

    págs. 697-705

    

  • Multiple Gate Delay Fault Diagnosis Using Test-Pairs for Marginal Delays

    K. O. Boateng, Haruhisa Takahashi, Y. Takamatsu

    págs. 706-715

    

  • On Properties of Kleene TDDs

    Yukihiro Iguchi, Tsutomu Sasao, Munehiro Matsuura

    págs. 716-723

    

  • Logic Optimization: Redundancy Addition and Removal Using Implication Relations

    Hideyuki Ichihara, K. Kinoshita

    págs. 724-730

    

  • Guided-Probe Diagnosis of LSIs Containing Macrocells

    N. Kuji, T. Takeda

    págs. 731-737

    

  • A New Autofocus Using Image Processing Techniques in Critical Dimension Measurement SEM

    F. Komatsu, H. Motoki, M. Miyoshi

    págs. 738-742

    

  • Highly Sensitive OBIRCH System for Fault Localization and Defect Detection

    K. Nikawa, Satoshi Inoue

    págs. 743-748

    

  • On Testing of Josephson Logic Circuits Composed of the 4JL Gates

    T. Yamada, T. Sasaki

    págs. 749-752

    

  • State Diagrams of Elementary Cellular Automata with Arbitrary Boundary Conditions

    P. Y. Koh, K. Furuya

    págs. 753-758