págs. 1-1
págs. 1-6
págs. 7-13
págs. 14-23
Investigating the impact of the defect dynamic characteristics on the PBTI in the high-κ gate device
Xianqiang Liu, Xiaodi Xu, Chenjie Gu, Renyuan Gu, Weiwei Wang, Wenjun Liu, Tianli Duan
págs. 24-28
págs. 29-36
págs. 37-41
págs. 42-46
págs. 47-54
Anil Kunwar, Shengyan Shang, Peter Råback, Yunpeng Wang, Julien Givernaud, Jun Chen, Haitao Ma, Xueguan Song, Ning Zhao
págs. 55-67
págs. 68-78
Microstructures and properties of Bi10Ag high temperature solder doped with Cu element
Limeng Yin, Dong Li, Zongxiang Yao, Gang Wang, Adrian Blackburn
págs. 79-84
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs
Chulseung Lim, Kyungbae Park, Geunyong Bak, Donghyuk Yun, Myungsang Park, Sanghyeon Baeg, ShiJie Wen, Richard Wong
págs. 85-90
págs. 91-99
Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors
Xavier Garros, Antoine Laurent, Alexandre Subirats i Armengol, X. Federspiel, E. Vincent, Gilles Reimbold
págs. 100-108
As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction
págs. 109-123
págs. 124-133
págs. 134-143
págs. 144-148
Adaptive accelerated aging for 28 nm HKMG technology
Devyani Patra, Ahmed Kamal Reza, Mohammad Khaled Hassan, Mehdi Katoozi, Ethan H. Cannon, Kaushik Roy, Yu Cao
págs. 149-154
Ultra-low-voltage boosted driver for self-powered systems
Michal Šovčík, Martin Kováč, Daniel Arbet, Viera Stopjaková, Miroslav Potočný
págs. 155-163
Compact modeling of dynamic trap density evolution for predicting circuit-performance aging
M. Miura Mattausch, H. Miyamoto, H. Kikuchihara, T.K. Maiti, N. Rohbani, D. Navarro, H. J. Mattausch
págs. 164-175
págs. 176-183
Design for reliability of generic sensor interface circuits
Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Konstantin Tscherkaschin, Steffen Paul, Dagmar Peters-Drolshagen
págs. 184-197
págs. 198-204
Modulation method for measuring thermal impedance components of semiconductor devices
Vitaliy I. Smirnov, Vyacheslav A. Sergeev, A.A. Gavrikov, A.M. Shorin
págs. 205-212
págs. 213-222
Non-linear thermal simulation at system level: Compact modelling and experimental validation
Mirko Bernardoni, Nicola Delmonte, Diego Chiozzi, Paolo Cova
págs. 223-229
Embedding a feedforward controller into the IGBT gate driver for turn-on transient improvement
Hamidreza Ghorbani, Vicent Sala Caselles, Alejandro Parades Camacho, Jose Luis Romeral Martinez
págs. 230-240
págs. 241-248
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