págs. 1-1
págs. 2-2
págs. 2-8
The distributed thermal model of fin field effect transistor
Mariusz Zubert, Tomasz Raszkowski, Agnieszka Samson, Marcin Janicki, Andrzej K. T. Napieralski
págs. 9-14
Analysis of nonlinear heat exchange phenomena in natural convection cooled electronic systems
Gilbert De Mey, Tomasz Torzewicz, Piotr Kawka, Andrzej Czerwoniec, Marcin Janicki, Andrzej K. T. Napieralski
págs. 15-20
págs. 21-28
págs. 29-37
Advanced thermal simulation of SiGe: C HBTs including back-end-of-line
Vincenzo d'Alessandro, Alessandro Magnani, Lorenzo Codecasa, Niccolò Rinaldi, Klaus Aufinger
págs. 38-45
págs. 46-53
Eric Monier-Vinard, Brice Rogié, Cheikh Tidiane Dia, Valentin Bissuel, Najib Laraqi, Olivier Daniel, Marie-Cécile Kotelon, Aben-Ibrahim Fahad
págs. 54-63
Analysis of aging effects - From transistor to system level
Maike Taddiken, Nico Hellwege, Nils Heidmann, Dagmar Peters-Drolshagen, Steffen Paul
págs. 64-73
págs. 74-81
págs. 82-88
Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs
Wenqi Zhang, Tzuo-Li Wang, Yan-Hua Huang, Tsu-Ting Cheng, Shih-Yao Chen, Yi-Ying Li, Chun-Hsiang Hsu, Chih-Jui Lai, Wen-Kuan Yeh, Yi-Lin Yang
págs. 89-93
Enhancement of light-emitting diode reliability using silicone microsphere in encapsulant
Inseok Jang, Wan-Ho Kim, Sie-Wook Jeon, Hyeon Kim, Jae-Pil Kim
págs. 94-98
págs. 99-103
Study of total ionizing dose induced read bit errors in magneto-resistive random access memory
Haohao Zhang, Jinshun Bi, Haibin Wang, Hongyang Hu, Jin Li, Lanlong Ji, Ming Liu
págs. 104-110
págs. 111-119
págs. 120-128
X-ray inspection of TSV defects with self-organizing map network and Otsu algorithm
Junjie Shen, Pengfei Chen, Lei Su, Tielin Shi, Zirong Tang, Guanglan Liao
págs. 129-134
págs. 135-142
págs. 143-149
págs. 150-158
Weiliang Wang, Karim Khan, Xingye Zhang, Haiming Qin, Jun Jiang, Lijing Miao, Kemin Jiang, Pengjun Wang, Mingzhi Dai, Junhao Chu
págs. 159-160
© 2001-2024 Fundación Dialnet · Todos los derechos reservados